SAT Based Automated Test Case Generation For MUMCUT Coverage
Jun Yan and Jian Zhang
The 17th IEEE International Symposium on Software Reliability Engineering (Student Program Papers ISSRE 2006)
Raleigh, North Carolina, USA, November 6-10, 2006
Abstract
MUMCUT is a criterion for testing Boolean specifications. The traditional test case generation methods for this problem are based on some approximate approaches. The efficiency of these algorithms depend on the designers' experience on this coverage. In this paper, the authors apply SAT based method to process this problem. Two SAT solvers, walksat and zChaff, are employed to generate approximate and optimal test case set respectively. The experimental results show that the two SAT methods are efficient.